Publications

Report Criteria
Type: Journal
Instruments: X-ray reflectometer
  1. Hurtado, C; Andreoli, T; Le Brun, AP; MacGregor, M; Darwish, N and Ciampi, S, Galinstan Liquid Metal Electrical Contacts for Monolayer-Modified Silicon Surfaces, Langmuir 40(1), 201-210 (2024) (from X-ray reflectometer) DOI
  2. Pradeepkumar, A; Cortie, D; Smyth, E; Le Brun, AP and Iacopi, F, Epitaxial graphene growth on cubic silicon carbide on silicon with high temperature neutron reflectometry: an operando study, RSC Adv. 14(5), 3232-3240 (2024) (from Spatz, X-ray reflectometer) DOI
  3. Bake, A; Zhang, Q; Ho, CS; Causer, GL; Zhao, W; Yue, Z; Nguyen, A; Akhgar, G; Karel, J; Mitchell, D; Pastuovic, Z; Lewis, R; Cole, JH; Nancarrow, M; Valanoor, N; Wang, X and Cortie, D, Top-down patterning of topological surface and edge states using a focused ion beam, Nat. Commun. 14(1), 1693 (2023) (from Physical Properties Measurement System, Spatz, X-ray reflectometer) DOI
  4. Bryant, SJ; Shaw, ZL; Huang, LZY; Elbourne, A; Abraham, AN; Vongsvivut, J; Holt, SA; Greaves, TL and Bryant, G, Insights into Chemical Interactions and Related Toxicities of Deep Eutectic Solvents with Mammalian Cells Observed Using Synchrotron Macro-ATR-FTIR Microspectroscopy, Biophysica 3(2), 318-334 (2023) (from Platypus, X-ray reflectometer) DOI
  5. Gresham, IJ; Willott, JD; Johnson, EC; Li, P; Webber, GB; Wanless, EJ; Nelson, ARJ and Prescott, SW , Effect of surfactants on the thermoresponse of PNIPAM investigated in the brush geometry, , J. Colloid Interface Sci. 631, 260-271 (2023) (from Imaging Ellipsometer, Platypus, X-ray reflectometer) DOI
  6. Nguyen, KV; Gluschke, JG; Mostert, AB; Nelson, A; Burwell, G; Lyttleton, RW; Cavaye, H; Welbourn, RJL; Seidl, J; Lagier, M; Miranda, MS; McGettrick, JD; Watson, T; Meredith, P and Micolich, AP, The Effect of Direct Electron Beam Patterning on the Water Uptake and Ionic Conductivity of Nafion Thin Films, Adv. Electron. Mater. 9(8), Art. No. 2300199 (2023) (from Platypus, X-ray reflectometer) DOI
  7. Turpin, GA; Nelson, A; Holt, SA; Giles, LW; Milogrodzka, I; Horn, RG; Tabor, RF and Hag, Lvt, Investigating Adsorption of Cellulose Nanocrystals at Air–Liquid and Substrate–Liquid Interfaces after pH Manipulation, Advanced Materials Interfaces 10(11), Art. No. 2202452 (2023) (from X-ray reflectometer) DOI
  8. Ferrie, S; Le Brun, AP; Krishnan, G; Andersson, GG; Darwish, N and Ciampi, S, Sliding silicon-based Schottky diodes: Maximizing triboelectricity with surface chemistry, Nano Energy 93, 106861 (2022) (from X-ray reflectometer) DOI
  9. Hurtado, C; Lyu, X; Ferrie, S; Le Brun, AP; MacGregor, M and Ciampi, S, Organic Monolayers on Si(211) for Triboelectricity Generation: Etching Optimization and Relationship between the Electrochemistry and Current Output, ACS Appl. Nano Mater. 5(10), 14263-14274 (2022) (from X-ray reflectometer) DOI
  10. McCoy, TM; Armstrong, AJ; Moore, JE; Holt, SA; Tabor, RF and Routh, AF, Spontaneous surface adsorption of aqueous graphene oxide by synergy with surfactants, Phys. Chem. Chem. Phys. 24(2), 797-806 (2022) (from X-ray reflectometer) DOI
  11. Rahpeima, S; Le Brun, A; Raston, CL and Darwish, N, Electro-polymerization rates of diazonium salts are dependent on the crystal orientation of the surface, J. Colloid Interface Sci. 626, 985-994 (2022) (from X-ray reflectometer) DOI
  12. Robertson, H; Gresham, IJ; Prescott, SW; Webber, GB; Wanless, EJ and Nelson, A, refellips: A Python package for the analysis of variable angle spectroscopic ellipsometry data, SoftwareX 20, Art. No. 101225 (2022) (from Imaging Ellipsometer, Spatz, X-ray reflectometer) DOI
  13. Schefer, TA; Cortie, DL and Kostylev, M, The effect of hydrogen gas on Pd/[Co/Pd]30/Pd multilayer thin films, J. Magn. Magn. Mater. 551, 169184 (2022) (from X-ray reflectometer) DOI
  14. Turpin, GA; Nelson, A; Holt, SA; Giles, LW; Milogrodzka, I; Teo, BM; Raghuwanshi, VS; Horn, RG; van 't Hag, L and Tabor, RF, Investigating Adsorption of Cellulose Nanocrystals at Air–Liquid and Solid–Liquid Interfaces in the Presence of Hydrotropes, Advanced Materials Interfaces 9(31), Art. No. 2200791 (2022) (from X-ray reflectometer) DOI
  15. Bake, A; Rezoanur Rahman, M; Evans, PJ; Cortie, M; Nancarrow, M; Abrudan, R; Radu, F; Khaydukov, Y; Causer, G; Callori, S; Livesey, KL; Mitchell, D; Pastuovic, Z; Wang, X and Cortie, D, Structure and magnetism of ultra-small cobalt particles assembled at titania surfaces by ion beam synthesis, Appl. Surf. Sci. 570, 151068 (2021) (from Platypus, X-ray reflectometer) DOI
  16. Bergendal, E; Gutfreund, P; Pilkington, GA; Campbell, RA; Müller-Buschbaum, P; Holt, SA and Rutland, MW, Tuneable interfacial surfactant aggregates mimic lyotropic phases and facilitate large scale nanopatterning, Nanoscale 13(1), 371-379 (2021) (from Platypus, X-ray reflectometer) DOI
  17. Cheema, JA; Aydemir, N; Carraher, C; Khadka, R; Colbert, D; Lin, HT; Nelson, A; Kralicek, A and Travas-Sejdic, J, Insect odorant receptor nanodiscs for sensitive and specific electrochemical detection of odorant compounds, Sens. Actuators B Chem. 329, 129243 (2021) (from Platypus, X-ray reflectometer) DOI
  18. Gresham, IJ; Humphreys, BA; Willott, JD; Johnson, EC; Murdoch, TJ; Webber, GB; Wanless, EJ; Nelson, ARJ and Prescott, SW, Geometrical Confinement Modulates the Thermoresponse of a Poly(N-isopropylacrylamide) Brush, Macromolecules 54(5), 2541-2550 (2021) (from Imaging Ellipsometer, Platypus, X-ray reflectometer) DOI
  19. Gresham, IJ; Johnson, EC; Prescott, SW; Nelson, A; Wanless, EJ and Webber, GB, The direction of influence of specific ion effects on a pH and temperature responsive copolymer brush is dependent on polymer charge, Polymer 214, 123287 (2021) (from Imaging Ellipsometer, Platypus, X-ray reflectometer) DOI
  20. Gresham, IJ; Murdoch, TJ; Johnson, EC; Robertson, H; Webber, GB; Wanless, EJ; Prescott, SW and Nelson, ARJ, Quantifying the robustness of the neutron reflectometry technique for structural characterization of polymer brushes, J. Appl. Crystallogr. 54, 739-750 (2021) (from Imaging Ellipsometer, Platypus, X-ray reflectometer) DOI
  21. Jake A. McEwan, Andrew J. Clulow, Andrew Nelson, Anwen M. Krause-Heuer, Ross D. Jansen-van Vuuren, Paul L. Burn, and Ian R. Gentle, Diffusion in Organic Film Stacks Containing Solution-Processed Phosphorescent Poly(dendrimer) Dopants, ACS Appl. Mater. Interfaces 13(26), 30910-30920 (2021) (from NDF - Chemical Deuteration, Platypus, X-ray reflectometer) DOI
  22. Robertson, H; Johnson, EC; Gresham, IJ; Prescott, SW; Nelson, A; Wanless, EJ and Webber, GB, Competitive specific ion effects in mixed salt solutions on a thermoresponsive polymer brush, J. Colloid Interface Sci. 586, 292-304 (2021) (from Imaging Ellipsometer, Platypus, X-ray reflectometer) DOI
  23. Zhang, J; Yang, J; Causer, GL; Shi, J; Klose, F; Huang, J-K; Tseng, A; Wang, D; Zu, X; Qiao, L; Pham, A and Li, S, Realization of exchange bias control with manipulation of interfacial frustration in magnetic complex oxide heterostructures, Phys. Rev. B 17, 174444 (2021) (from Platypus, X-ray reflectometer) DOI
  24. Gresham, I. J.; Reurink, D. M.; Prescott, S. W.; Nelson, A. R. J.; de Vos, W. M. & Willott, J. D. , Structure and Hydration of Asymmetric Polyelectrolyte Multilayers as studied by Neutron Reflectometry: Connecting Multilayer Structure to Superior Membrane Performance , Macromolecules 53(23), 10644-10654 (2020) (from Imaging Ellipsometer, Platypus, X-ray reflectometer) DOI
  25. Johnson, EC; Willott, JD; Gresham, IJ; Murdoch, TJ; Humphreys, BA; Prescott, SW; Nelson, A; de Vos, WM; Webber, GB and Wanless, EJ, Enrichment of Charged Monomers Explains Non-monotonic Polymer Volume Fraction Profiles of Multi-stimulus Responsive Copolymer Brushes, Langmuir 36(42), 12460-12472 (2020) (from Imaging Ellipsometer, Platypus, X-ray reflectometer) DOI
  26. Turpin, GA; Holt, SA; Scofield, JMP; Teo, BM and Tabor, RF, Spontaneous Adsorption of Graphene Oxide to Oil–Water and Air–Water Interfaces by Adsorption of Hydrotropes, Advanced Materials Interfaces (2020) (from X-ray reflectometer) DOI
  27. Yang, W-C; Hong, J-W; Chang, J-H; Chen, Y-F; Nelson, A; Wang, Y-M; Chiang, Y-W; Wu, C-M and Sun, Y-S, Dispersity effects on phase behavior and structural evolution in ultrathin films of a deuterated polystyrene-block-poly(methyl methacrylate) diblock copolymer, Polymer 210, 123027 (2020) (from Platypus, X-ray reflectometer) DOI
  28. Jarvis, K.; Evans, P.; Nelson, A. & Triani, G, Comparisons of alumina barrier films deposited by thermal and plasma atomic layer deposition, Mater. Today Chem. 11, 8-15 (2019) (from X-ray reflectometer) DOI
  29. Peiris, CR; Vogel, YB; Le Brun, AP; Aragonès, AC; Coote, ML; Díez-Pérez, I; Ciampi, S and Darwish, N, Metal–Single-Molecule–Semiconductor Junctions Formed by a Radical Reaction Bridging Gold and Silicon Electrodes, J. Am. Chem. Soc. 141(37), 14788-14797 (2019) (from X-ray reflectometer) DOI
  30. Shou, K; Hong, JK; Wood, ES; Hook, JM; Nelson, A; Yin, Y; Andersson, GG; Abate, A; Steiner, U and Neto, C, Ultralow surface energy self-assembled monolayers of iodo-perfluorinated alkanes on silica driven by halogen bonding, Nanoscale 11(5), 2401-2411 (2019) (from X-ray reflectometer) DOI
  31. Zhang, J; Causer, GL; Liu, X; Ionescu, M; Li, S; Lin, KW and Klose, F, Controlling the magnetic reversal mechanism of exchange biased MnxOy/Ni80Fe20 bilayers through O+ implantation, J. Magn. Magn. Mater. 476, 437-446 (2019) (from Physical Properties Measurement System, Platypus, X-ray reflectometer) DOI
  32. Alqahtani, O; Babics, M; Gorenflot, J; Savikhin, V; Ferron, T; Balawi Ahmed, H; Paulke, A; Kan, Z; Pope, M; Clulow Andrew, J; Wolf, J; Burn Paul, L; Gentle Ian, R; Neher, D; Toney Michael, F; Laquai, F; Beaujuge Pierre, M and Collins Brian, A, Mixed Domains Enhance Charge Generation and Extraction in Bulk‐Heterojunction Solar Cells with Small‐Molecule Donors, Adv. Energy. Mater. 8(19), 1702941 (2018) (from Platypus, X-ray reflectometer) DOI
  33. Cole, JM; Gong, Y; McCree-Grey, J; Evans, PJ and Holt, SA, Modulation of N3 and N719 dye···TiO2 Interfacial Structures in Dye-Sensitized Solar Cells As Influenced by Dye Counter Ions, Dye Deprotonation Levels, and Sensitizing Solvent, Appl. Energy Mater. 1(6), 2821-2831 (2018) (from X-ray reflectometer) DOI
  34. McEwan, JA; Clulow, AJ; Nelson, A; Wang, R; Burn, PL and Gentle, IR, Influence of Dopant Concentration and Steric Bulk on Interlayer Diffusion in OLEDs, Advanced Materials Interfaces 5(1), 1700872 (2018) (from Platypus, X-ray reflectometer) DOI
  35. Paull, O; Pan, AV; Causer, GL; Fedoseev, SA; Jones, A; Liu, X; Rozenfeld, A and Klose, F, Field Dependence of the Ferromagnetic/Superconducting Proximity Effect in a YBCO/STO/LCMO Multilayer, Nanoscale 10, 18995-19003 (2018) (from Physical Properties Measurement System, Platypus, X-ray reflectometer) DOI
  36. Voorhaar, L; Chan, EWC; Baek, P; Wang, M; Nelson, A; Barker, D and Travas-Sejdic, J, Self-healing polythiophene phenylenes for stretchable electronics, European Polymer Journal 105, 331-338 (2018) (from Platypus, X-ray reflectometer) DOI
  37. Wang, M; Baek, P; Voorhaar, L; Chan, EWC; Nelson, A; Barker, D and Travas-Sejdic, J, Long side-chain grafting imparts intrinsic adhesiveness to poly(thiophene phenylene) conjugated polymer, European Polymer Journal 109, 237-247 (2018) (from X-ray reflectometer) DOI
  38. Zhang, L; Laborda, E; Darwish, N; Noble, BB; Tyrell, JH; Pluczyk, S; Le Brun, AP; Wallace, GG; Gonzalez, J; Coote, ML and Ciampi, S, Electrochemical and Electrostatic Cleavage of Alkoxyamines, J. Am. Chem. Soc. 140(2), 766-774 (2018) (from X-ray reflectometer) DOI
  39. Akers, PW; Dingley, AJ; Swift, S; Nelson, ARJ; Martin, J and McGillivray, DJ, Using Neutron Reflectometry to Characterize Antimicrobial Protein Surface Coatings, J. Phys. Chem. B 121(24), 5908-5916 (2017) (from Platypus, X-ray reflectometer) DOI
  40. Burn, PL; McEwan, JA; Clulow, AJ; Wang, R; Nelson, A and Gentle, IR, 77-2: Invited Paper: Probing the Thermal Stability of OLEDs with Neutrons, SID Symposium Digest of Technical Papers 48(1), 1129-1133 (2017) (from Platypus, X-ray reflectometer) DOI
  41. Callori, SJ; Chao, KH; Causer, GL; Nagy, B; Kiss, LF; Sulyok, A; Bottyán, L; Lin, KW and Klose, F, Fe/FeO/Fe/FeV Multilayers Characterized by Magnetometry and Polarized Neutron Reflectometry, IEEE Magnetics Letters 8, 1-5 (2017) (from Platypus, X-ray reflectometer) DOI
  42. Clulow, AJ; Mostert, AB; Sheliakina, M; Nelson, A; Booth, N; Burn, PL; Gentle, IR and Meredith, P, The structural impact of water sorption on device-quality melanin thin films, Soft Matter 13(21), 3954-3965 (2017) (from Platypus, X-ray reflectometer) DOI
  43. Cortie, DL; Khaydukov, Y; Keller, T; Sprouster, DJ; Hughes, JS; Sullivan, JP; Wang, XL; Le Brun, AP; Bertinshaw, J; Callori, SJ; Aughterson, R; James, M; Evans, PJ; Triani, G and Klose, F, Enhanced Magnetization of Cobalt Defect Clusters Embedded in TiO2−δ Films, ACS Appl. Mater. Interfaces 9(10), 8783-8795 (2017) (from Platypus, X-ray reflectometer) DOI
  44. Hossain, KR; Holt, SA; Le Brun, AP; Al Khamici, H and Valenzuela, SM, X-ray and Neutron Reflectivity Study Shows That CLIC1 Undergoes Cholesterol-Dependent Structural Reorganization in Lipid Monolayers, Langmuir 33(43), 12497-12509 (2017) (from NDF - Biodeuteration, Platypus, X-ray reflectometer) DOI
  45. McCoy, TM; Holt, SA; Rozario, AM; Bell, TDM and Tabor, RF, Surfactant-Enhanced Adsorption of Graphene Oxide for Improved Emulsification of Oil in Water, Advanced Materials Interfaces 4(23), Art. No. 1700803 (2017) (from X-ray reflectometer) DOI
  46. McCree-Grey, J; Cole, JM; Holt, SA; Evans, PJ and Gong, Y, Dye···TiO2 interfacial structure of dye-sensitised solar cell working electrodes buried under a solution of I-/I3- redox electrolyte, Nanoscale 9(32), 11793 - 11805 (2017) (from Platypus, X-ray reflectometer) DOI
  47. McEwan, JA; Clulow, AJ; Nelson, A; Yepuri, NR; Burn, PL; Gentle, IR, Dependence of Organic Interlayer Diffusion on Glass-Transition Temperature in OLEDs, ACS Appl. Mater. Interfaces 9(16), 14153-14161 (2017) (from Platypus, X-ray reflectometer) DOI
  48. Murdoch, T. J.; Humphreys, B. A.; Willott, J. D.; Prescott, S. W.; Nelson, A.; Webber, G. B. & Wanless, E. J., Enhanced Specific Ion Effects in Ethylene Glycol-based Thermoresponsive Polymer Brushes, J. Colloid Interface Sci. 490, 869-878 (2017) (from Platypus, X-ray reflectometer) DOI
  49. Tayeb, HH; Piantavigna, S; Howard, CB; Nouwens, A; Mahler, SM; Middelberg, APJ; He, L; Holt, SA and Sainsbury, F, Insights into the interfacial structure-function of poly(ethylene glycol)-decorated peptide-stabilised nanoscale emulsions, Soft Matter 13(43), 7953-7961 (2017) (from X-ray reflectometer) DOI
  50. Tonnelé, C; Stroet, M; Caron, B; Clulow, AJ; Nagiri, RCR; Malde, AK; Burn, PL; Gentle, IR; Mark, AE and Powell, BJ, Elucidating the Spatial Arrangement of Emitter Molecules in Organic Light-Emitting Diode Films, Angew. Chem. Int. Ed. Engl. 56(29), 8402-8406 (2017) (from Platypus, X-ray reflectometer) DOI
  51. Bertinshaw, J; Maran, R; Callori, SJ; Ramesh, V; Cheung, J; Danilkin, SA; Lee, WT; Hu, S; Seidel, J; Valanoor, N and Ulrich, C, Direct evidence for the spin cycloid in strained nanoscale bismuth ferrite thin films, Nat. Commun. 7, Art. No. 12664 (2016) (from Taipan, X-ray reflectometer) DOI
  52. Cranfield C.G., Berry T., Holt, S, Hossain K., R.,,. Le Brun A. P., Carne S,, Al Khamici H.,, Coster H., Valenzuela S.M., and Cornell B., Evidence of the Key Role of H3O+ in Phospholipid Membrane Morphology, Langmuir 32(41), 10725-10734 (2016) (from Platypus, X-ray reflectometer) DOI
  53. Li, H; Le Brun, AP; Agyei, D; Shen, W; Middelberg, APJ and He, L, Stabilizing and destabilizing protein surfactant-based foams in the presence of a chemical surfactant: Effect of adsorption kinetics, J. Colloid Interface Sci. 462, 56-63 (2016) (from X-ray reflectometer) DOI
  54. Li, Y; Nelson, A; Easton, CD; Nisbet, DR; Forsythe, JS and Muir, BW, Probing the Interfacial Structure of Bilayer Plasma Polymer Films via Neutron Reflectometry, Plasma Processes Polym. 13(5), 534-543 (2016) (from Platypus, X-ray reflectometer) DOI
  55. McEwan, JA; Clulow, AJ; Shaw, PE; Nelson, A; Darwish, TA; Burn, PL and Gentle, IR, Diffusion at interfaces in OLEDs containing a doped phosphorescent emissive layer, Advanced Materials Interfaces 3(17), 1600184 (2016) (from Platypus, X-ray reflectometer) DOI
  56. Murdoch, TJ; Willott, JD; de Vos, WM; Nelson, A; Prescott, SW; Wanless, EJ and Webber, GB , Influence of Anion Hydrophilicity on the Conformation of a Hydrophobic Weak Polyelectrolyte Brush, Macromolecules 49(24), 9605-9617 (2016) (from Platypus, X-ray reflectometer) DOI
  57. Omar Al-Khayat,Kieran Geraghty, Keyun Shou, Andrew Nelson, Chiara Neto, Chain collapse and interfacial slip of polystyrene films in good/non-solvent vapor mixtures, Macromolecules 49(4), 1344-1352 (2016) (from X-ray reflectometer) DOI
  58. Timothy J. Murdoch, Ben A. Humphreys, Joshua D. Willott, Kasimir P. Gregory, Stuart W. Prescott, Andrew Nelson, Erica J. Wanless, Grant B. Webber, Specific Anion Effects on the Internal Structure of a poly(N-isopropylacrylamide) Brush, Macromolecules 49(16), 6050-6060 (2016) (from Platypus, X-ray reflectometer) DOI
  59. Zhang, L; Vogel, YB; Noble, BB; Gonçales, VR; Darwish, N; Brun, AL; Gooding, JJ; Wallace, GG; Coote, ML and Ciampi, S, TEMPO Monolayers on Si(100) Electrodes: Electrostatic Effects by the Electrolyte and Semiconductor Space-Charge on the Electroactivity of a Persistent Radical, J. Am. Chem. Soc. 138(30), 9611-9619 (2016) (from X-ray reflectometer) DOI
  60. Akers, PW; Nelson, ARJ; Williams, DE and McGillivray, DJ, Formation of hydrated layers in PMMA thin films in aqueous solution , Appl. Surf. Sci. 353, 829-834 (2015) (from Computing Cluster, Platypus, X-ray reflectometer) DOI
  61. Bilek, MMM; Kondyurin, A; Dekker, S; Steel, BC; Wilhelm, RA; Heller, R; McKenzie, DR; Weiss, AS; James, M and Möller, W, Depth-Resolved Structural and Compositional Characterization of Ion-Implanted Polystyrene that Enables Direct Covalent Immobilization of Biomolecules, J. Phys. Chem. C 119(29), 16793-16803 (2015) (from Platypus, X-ray reflectometer) DOI
  62. Ciampi, S; Choudhury, MH; Ahmad, S; Darwish, N; Le Brun, A and Gooding, JJ, The impact of surface coverage on the kinetics of electron transfer through redox monolayers on a silicon electrode surface, Electrochemistry. Acta 186, 216-222 (2015) (from X-ray reflectometer) DOI
  63. Grant, DS; Bazaka, K; Siegele, R; Holt, SA and Jacob, MV, Ion irradiation as a tool for modifying the surface and optical properties of plasma polymerised thin films, Nucl. Instrum. Methods Phys. Res., Sect. A 360, 54-59 (2015) (from X-ray reflectometer) DOI
  64. Knobloch, JJ; Nelson, ARJ; Köper, I; James, M and McGillivray, DJ, Oxidative Damage to Biomimetic Membrane Systems: In Situ Fe(II)/Ascorbate Initiated Oxidation and Incorporation of Synthetic Oxidized Phospholipids, Langmuir 31(46), 12679-12687 (2015) (from Platypus, X-ray reflectometer) DOI
  65. McCree-Grey, J; Cole, JM and Evans, PJ, Preferred Molecular Orientation of Coumarin 343 on TiO2 Surfaces: Application to Dye-Sensitized Solar Cells, ACS Appl. Mater. Interfaces 7(30), 16404-16409 (2015) (from X-ray reflectometer) DOI
  66. Su, J; Garvey, CJ; Holt, S; Tabor, RF; Winther-Jensen, B; Batchelor, W and Garnier, G, Adsorption of cationic polyacrylamide at the cellulose–liquid interface: A neutron reflectometry study, J. Colloid Interface Sci. 448, 88-99 (2015) (from Platypus, X-ray reflectometer) DOI
  67. Ciampi, S; Luais, E; James, M; Choudhury, MH; Darwish, NA and Gooding, JJ, The rapid formation of functional monolayers on silicon under mild conditions, Phys. Chem. Chem. Phys. 16(17), 8003-8011 (2014) (from NDF - Chemical Deuteration, X-ray reflectometer) DOI
  68. Clulow, AJ; Armin, A; Lee, KH; Pandey, AK; Tao, C; Velusamy, M; James, M; Nelson, A; Burn, PL; Gentle, IR and Meredith, P, Determination of Fullerene Scattering Length Density: A Critical Parameter for Understanding the Fullerene Distribution in Bulk Heterojunction Organic Photovoltaic Devices, Langmuir 30(5), 1410-1415 (2014) (from Platypus, X-ray reflectometer) DOI
  69. Cortie, DL; Brown, JD; Brück, S; Saerbeck, T; Evans, JP; Fritzsche, H; Wang, XL; Downes, JE and Klose, F, Intrinsic reduction of the ordered 4f magnetic moments in semiconducting rare-earth nitride thin films: DyN, ErN, and HoN, Phys. Rev. B 89(6), Art. No. 064424 (2014) (from Platypus, X-ray reflectometer) DOI
  70. Cortie, DL; Ting, Y-W; Chen, P-S; Tan, X; Lin, K-W and Klose, F, Enhancement of the magnetic interfacial exchange energy at a specific interface in NiFe/CoO/Co trilayer thin films via ion-beam modification, J. Appl. Phys. 115(7), Art. No. 073901 (2014) (from Platypus, X-ray reflectometer) DOI
  71. Hambsch, M; Jin, H; Clulow, AJ; Nelson, A; Yamada, NL; Velusamy, M; Yang, Q; Zhu, F; Burn, PL; Gentle, IR and Meredith, P, Improved stability of non-ITO stacked electrodes for large area flexible organic solar cells, Sol. Energ. Mat. Sol. Cells 130, 182-190 (2014) (from Platypus, X-ray reflectometer) DOI
  72. Parker, GK and Holt, SA, Characterization of the Deposition of n-Octanohydroxamate on Copper Surfaces, J. Electrochem. Soc. 161(5), D277-D286 (2014) (from Platypus, X-ray reflectometer) DOI
  73. Ciampi, S; James, M; Choudhury, MH; Darwish, NA and Gooding, JJ, The detailed characterization of electrochemically switchable molecular assemblies on silicon electrodes, Phys. Chem. Chem. Phys. 15(24), 9879-9890 (2013) (from X-ray reflectometer) DOI
  74. Pelliccia, D; Kandasamy, S and James, M, Characterization of thin films for X-ray and neutron waveguiding by X-ray reflectivity and atomic force microscopy, Phys. Status Solidi A-Appl. Mat. 210(11), 2416-2422 (2013) (from X-ray reflectometer) DOI
  75. Scholes, FH; Ehlig, T; James, M; Lee, KH; Duffy, N; Scully, AD; Singh, TB; Winzenberg, KN; Kemppinen, P and Watkins, SE, Intraphase Microstructure-Understanding the Impact on Organic Solar Cell Performance, Adv. Funct. Mater. 23(45), 5655-5662 (2013) (from Platypus, X-ray reflectometer) DOI
  76. Veder, J-P; Patel, K; Lee, J; Tanzirul Alam, M; James, M; Nelson, A and De Marco, R, Is ballistic transportation or quantum confinement responsible for changes in the electrical properties of thin polymer films?, Phys. Chem. Chem. Phys. 15(5), 1364-1368 (2013) (from X-ray reflectometer) DOI
  77. Bongiovanni, R; Nelson, A; Vitale, A and Bernardi, E, Ultra-thin films based on random copolymers containing perfluoropolyether side chains, Thin Solid Films 520(17), 5627-5632 (2012) (from X-ray reflectometer) DOI
  78. Ciampi, S; James, M; Le Saux, G; Gaus, K and Justin Gooding, J, Electrochemical ‘Switching’ of Silicon(100) Modular Assemblies, J. Am. Chem. Soc. 134(2), 844-847 (2012) (from X-ray reflectometer) DOI
  79. Guan, B; Ciampi, S; Luais, E; James, M; Reece, PJ and Gooding, JJ, Depth-Resolved Chemical Modification of Porous Silicon by Wavelength-Tuned Irradiation, Langmuir 28(44), 15444-15449 (2012) (from X-ray reflectometer) DOI
  80. Hong, D; Shin, K; James, M and Tae, G, Mimicking the receptor-aided binding of HIV-1 TAT protein transduction domains to phospholipid monolayers at the air-water interface, Soft Matter 8(33), 8616-8623 (2012) (from X-ray reflectometer) DOI
  81. Lauw, Y; Horne, MD; Rodopoulos, T; Lockett, V; Akgun, B; Hamilton, WA and Nelson, ARJ, Structure of [C4mpyr][NTf2] Room-Temperature Ionic Liquid at Charged Gold Interfaces, Langmuir 28(19), 7374-738 (2012) (from Computing Cluster, Platypus, X-ray reflectometer) DOI
  82. Menzies, DJ; Nelson, A; Shen, HH; McLean, KM; Forsythe, JS; Gengenbach, T; Fong, C and Muir, BW, An X-ray and neutron reflectometry study of 'PEG-like' plasma polymer films, J. R. Soc. Interface 9(70), 1008-1019 (2012) (from Platypus, X-ray reflectometer) DOI
  83. Smith, ARG; Lee, KH; Nelson, A; James, M; Burn, PL and Gentle, IR, Diffusion - the Hidden Menace in Organic Optoelectronic Devices, Adv. Mater. 24(6), 822-826 (2012) (from NDF - Chemical Deuteration, Platypus, X-ray reflectometer) DOI
  84. Stapleton, A; Vaughan, B; Xue, BF; Sesa, E; Burke, K; Zhou, XJ; Bryant, G; Werzer, O; Nelson, A; Kilcoyne, ALD; Thomsen, L; Wanless, E; Belcher, W and Dastoor, P, A multilayered approach to polyfluorene water-based organic photovoltaics, Sol. Energ. Mat. Sol. Cells 102, 114-124 (2012) (from X-ray reflectometer) DOI
  85. Wakeham, D; Niga, P; Ridings, C; Andersson, G; Nelson, A; Warr, GG; Baldelli, S; Rutland, MW and Atkin, R , Surface structure of a "non-amphiphilic" protic ionic liquid, Phys. Chem. Chem. Phys. 14(15), 5106-5114 (2012) (from Computing Cluster, X-ray reflectometer) DOI
  86. Walsh, RB; Howard, SC; Nelson, A; Skinner, WM; Liu, G and Craig, VSJ, Model Surfaces Produced by Atomic Layer Deposition, Chem. Lett. 41(10), 1247-1249 (2012) (from X-ray reflectometer) DOI
  87. Walsh, RB; Nelson, A; Skinner, WM; Parsons, D and Craig, VSJ, Direct Measurement of van der Waals and Diffuse Double-Layer Forces between Titanium Dioxide Surfaces Produced by Atomic Layer Deposition, J. Phys. Chem. C 116(14), 7838-7847 (2012) (from X-ray reflectometer) DOI
  88. Ciampi, S; James, M; Darwish, N; Luais, E; Guan, B; Harper, JB and Gooding, JJ, Oxidative acetylenic coupling reactions as a surface chemistry tool, Phys. Chem. Chem. Phys. 13(34), 15624-15632 (2011) (from X-ray reflectometer) DOI
  89. Ciampi, S; James, M; Michaels, P and Gooding, JJ, Tandem “Click” Reactions at Acetylene-Terminated Si(100) Monolayers, Langmuir 27(11), 6940-6949 (2011) (from X-ray reflectometer) DOI
  90. Griffith, MJ; James, M; Triani, G; Wagner, P; Wallace, GG and Officer, DL, Determining the Orientation and Molecular Packing of Organic Dyes on a TiO2 Surface Using X-ray Reflectometry, Langmuir 27(21), 12944-12950 (2011) (from X-ray reflectometer) DOI
  91. James, M; Ciampi, S; Darwish, TA; Hanley, TL; Sylvester, SO and Gooding, JJ , Nanoscale Water Condensation on Click-Functionalized Self-Assembled Monolayers , Langmuir 27(17), 10753-10762 (2011) (from X-ray reflectometer) DOI
  92. James, M; Darwish, TA; Ciampi, S; Sylvester, SO; Zhang, Z; Ng, A; Gooding, JJ and Hanley, TL, Nanoscale Condensation of Water on Self-Assembled Monolayers, Soft Matter 7(11), 5309–5318 (2011) (from Platypus, X-ray reflectometer) DOI
  93. Kjallman, THM; Nelson, A; James, M; Dura, JA; Travas-Sejdic, J and McGillivray, DJ, A neutron reflectivity study of the interfacial and thermal behaviour of surface-attached hairpin DNA, Soft Matter 7(10), 5020-5029 (2011) (from Platypus, X-ray reflectometer) DOI
  94. Velinov, T; Ahtapodov, L; Nelson, A; Gateshki, M and Bivolarska, M, Influence of the surface roughness on the properties of Au films measured by surface plasmon resonance and X-ray reflectometry, Thin Solid Films 519(7), 2093-2097 (2011) (from X-ray reflectometer) DOI
  95. Wagner, K; Griffith, MJ; James, M; Mozer, AJ; Wagner, P; Triani, G; Officer, DL and Wallace, GG, Significant Performance Improvement of Porphyrin-Sensitized TiO2 Solar Cells under White Light Illumination, J. Phys. Chem. C 115(1), 317-326 (2011) (from X-ray reflectometer) DOI
  96. Wakeham, D; Nelson, A; Warr, GG and Atkin, R, Probing the protic ionic liquid surface using X-ray reflectivity, Phys. Chem. Chem. Phys. 13(46), 20828-20835 (2011) (from X-ray reflectometer) DOI
  97. Niga, P; Wakeham, D; Nelson, A; Warr, GG; Rutland, M and Atkin, R, Structure of the Ethylammonium Nitrate Surface: An X-ray Reflectivity and Vibrational Sum Frequency Spectroscopy Study, Langmuir 26(11), 8282-8288 (2010) (from X-ray reflectometer) DOI
  98. Telford, AM; James, M; Meagher, L and Neto, C, Thermally Cross-Linked PNVP Films As Antifouling Coatings for Biomedical Applications, ACS Appl. Mater. Interfaces 2(8), 2399-2408 (2010) (from Platypus, X-ray reflectometer) DOI
  99. Ciampi, S; Eggers, PK; Le Saux, G; James, M; Harper, JB and Gooding, JJ, Silicon (100) Electrodes Resistant to Oxidation in Aqueous Solutions: An Unexpected Benefit of Surface Acetylene Moieties, Langmuir 25(4), 2530-2539 (2009) (from X-ray reflectometer) DOI
  100. Lauw, Y; Horne, MD; Rodopoulos, T; Webster, NAS; Minofar, B and Nelson, A, X-Ray reflectometry studies on the effect of water on the surface structure of [C(4)mpyr][NTf2] ionic liquid, Phys. Chem. Chem. Phys. 11(48), 11507-11514 (2009) (from X-ray reflectometer) DOI
  101. Ng, A; Ciampi, S; James, M; Harper, JB and Gooding, JJ, Comparing the Reactivity of Alkynes and Alkenes on Silicon (100) Surfaces, Langmuir 25(24), 13934-13941 (2009) (from X-ray reflectometer) DOI
  102. Muir, BW; Nelson, A; Fairbrother, A; Fong, C; Hartley, PG; James, M and McLean, KM, A Comparative X-Ray and Neutron Reflectometry Study of Plasma Polymer Films Containing Reactive Amines , Plasma Processes Polym. 4(4), 433-444 (2007) (from X-ray reflectometer) DOI
  103. Nelson, A; Muir, BW; Oldham, J; Fong, C; McLean, KM; Hartley, PG; Oiseth, SK and James, M, X-ray and neutron reflectometry study of glow-discharge plasma polymer films , Langmuir 22(1), 453-458 (2006) (from X-ray reflectometer) DOI